X-Ray Inspection System

Jing Teng Tech Limited Company
View:

X-eye 5100 Series

Non-destructive analysis of semiconductor, SMT, and electron/electric components

X-eye SF160 Series 非破壞式穿透檢查機

Non-destructive analysis of semiconductor, SMT, and electron/electric components.
Hybrid Tube Option (160kv/500㎛, 10,000hrs/filament)
Dual CT - High-quality CT image / high speed scan.

X-eye 6300 非破壞式穿透檢查機

High speed 3D In Line Inspection System (~4.3 sec/FOV)
Best Solution for both-side layered PCB
Hybrid Tube with long life span for In-line purpose (10,000hrs/Filament)