• X-eye SF160 Series 非破壞式穿透檢查機
  • X-eye SF160 Series 非破壞式穿透檢查機
  • X-eye SF160 Series 非破壞式穿透檢查機
X-eye SF160 Series

X-eye SF160 Series 非破壞式穿透檢查機

Non-destructive analysis of semiconductor, SMT, and electron/electric components.
Hybrid Tube Option (160kv/500㎛, 10,000hrs/filament)
Dual CT - High-quality CT image / high speed scan.

Best performance X-ray Inspection System
High-performance Micro-focus Open Tube with 160kV is installed and fine defects of 1㎛ are detectable.
High-resolution X-ray image can be gained with world best magnification by installing high-price Open Tube as standard.
Dual CT function can be purchased additionally, and exact location & size of defects can be detected and analyzed with this function.


X-ray Tube 160 kV / 200 µA (option 160 kV / 500 µA)
Min. Resolution 0.9 µm
Table Size 460 X 510 mm (option 550 X 650 mm)
AXIS X, Y, Z, Tilt (70º), R, Y-aft, Cone beam R
Detector 5 inch Pixel FPD
CT Scan Method Oblique CT / Cone beam CT
Foot print 1,340mm x 1,460mm x 1,670mm
Weight 2,000kg
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